Integrated X-ray Photoelectron Spectroscopy and Raman Spectroscopy System for Advanced Materials Research at UCC

Tyndall National Institute at University College Cork (UCC) is seeking suppliers to provide a complete integrated analytical system comprising an X-ray Photoelectron Spectroscopy (XPS) module and a collocated Raman Spectroscopy module. The XPS system will analyze chemical composition and electronic structure of thin films including metal oxides and 2D materials produced by the institute's Atomic Layer Deposition (ALD) facility, which supports Europe's first beyond-2 nm System-on-Chip (SoC) pilot line. The Raman module will perform complementary structural, vibrational, and stress analysis on the same materials. The selected vendor must supply, deliver, install, commission, and validate the fully integrated system to provide comprehensive surface and bulk characterization capabilities for next-generation ALD materials research. This is a complete turnkey solution for advanced semiconductor materials characterization.